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Working productively with the CharFac staff

General Staff

For general and/or nontechnical inquiries, please contact the following staff members:


Constance Sorenson Front desk, registration, keys/supplies 626-7594
Lora Witte General administrative, database/billing 626-3896
John Kadlec Facilities management/safety, lab maintenance/troubleshooting 624-4136
Greg Haugstad Director; tours, collaboration
Schedule  (Requires U of M X.500 login)		 625-1352
Alice Ressler External client relations, service contracts, lab user agreements, tours 626-5315
John Schafer Webmaster, IT support 625-9634

Technical Staff

Technical specialists oversee instruments in the Characterization Facility, develop capabilities, and provide expert analytical services, training & assistance.  Please contact the following with specific technical inquiries:

Jinping Dong confocal Raman, FTIR, SPM/AFM, ellipsometry (analysis) 625-1841
Wei Fan X-ray scattering (Small angle X-ray scattering) 626-8655
Chris Frethem SEM (cryo and bio emphasis) 624-4652
Bob Hafner SEM/TEM (educational emphasis, remote) 626-5314
Greg Haugstad SPM/AFM (educational and remote),IBA/RBS, ToF-SIMS
Schedule  (Requires U of M X.500 login)		 625-1352
John Kadlec SEM specimen prep 624-4136
Bing Luo X-ray photoelectron and Auger spectroscopy/sputter profiling, ToF-SIMS 626-2262
John Nelson SEM, nanomechanical testing, stylus profilometry, light microscopy
Schedule  (Requires U of M X.500 login)		 625-4893
Alice Ressler specimen prep, TEM (bio emphasis), (cryo)microtomy 626-5315
Nicholas Seaton SEM/EBSD postdoc
John Thomas X-ray photoelectron and Auger spectroscopy/sputter profiling, IBA 626-9657
Maria Torija X-ray scattering (XRD/SAXS)
Ozan Ugurlu TEM (HR/STEM/EDS/EELS), FIB 626-3613
Venugopal Rao Vangala X-ray diffraction (XRD/SAXS) 624-1677
(All phone numbers in 612 area code.)