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A Structural Resolution Cryo-TEM Study of the Early Stages of MFI Growth
Journal of the American Chemical Society, 130 (51), 17284, 2 Dec 2008

Figure: A high-resolution cryo-TEM image of a representative crystal in synthesis sol aged for 220 days at room-temperature. Fast Fourier transform (FFT), shown in the inset, indicates the crystal to be oriented either along [100]- or [010]-axis. The bright and dark dots within the high-lighted perimeter represent the straight or sinusoidal pores of the MFI framework structure. Image obtained using the FEI Tecnai G2 F30 Cryo-TEM.
Abstract and article at Journal of the American Chemical Society
CharFac Offers New Instrument
The CharFac is pleased to announce a new TEM PicoIndenter (Hysitron), capable of nanomechanical testing inside of a transmission electron microscope (TEM). CharFac is one of the first facilities in the world with this capability With the PicoIndenter, quantitative force-displacement curves can be time correlated to the corresponding TEM movie of the stress-induced deformation processes. The combination of CharFac’s high-end FEI TEMs and this analytical tool will enable researchers to witness the nanoscale structural changes corresponding to observed force and displacement transients. Some example applications are direct observation of depth-sensing indentations, quantitative compression testing, and defect formations such as dislocations, stacking faults, twins, etc.
