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Transmission Electron Microscope

FEI Tecnai T12

Location:  77 Shepherd Labs

Contact:  Jason Myers

Instruction manual   [  PDF 1.1MB]

TEM Primer   [  PDF 3.3MB]

TEM Training Policy   [  PDF 17.9kB]


  • The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency.
  • Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts.
  • LaB6 source.
  • Accelerating voltage range of 20 to 120 kV.
  • Magnifications up to 700,000x.
  • Point resolution: 0.34 nm; Line resolution: 0.2 nm.
  • Maximum specimen tilt: 70�.
  • Drift rate: <1 nm / min.
  • Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders.
  • Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows detection of elements from beryllium to uranium.

Sample applications include:

  • Composition analysis structure of grain boundaries in ceramics.
  • Magnetic films on chromium.
  • Identification of precipitates in materials.
  • Analysis of nanoparticle sizes.

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