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Field Emission Gun
Transmission Electron Microscope

FEI Tecnai G2 F30

Location:  73 Shepherd Labs

Contact:  Ozan Ugurlu, Bob Hafner

Specifications:

  • The Tecnai G2 F30 field-emission gun transmission electron microscope combines all imaging, diffraction, and analytical techniques at high spatial resolution and detection efficiency.  The high-brightness, high coherency gun will allow large electron probe currents to be focused onto nanometer sized areas of the specimen.
  • Application-Specific Modes include: High-resolution bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; large specimen tilt compatible with high resolution; STEM imaging; and, high angle annular dark-field imaging.
  • Accelerating voltage range of 50 to 300 kV.
  • Magnifications up to >1 million times.
  • Point-point resolution: 0.20 nm; Information limit: 0.14 nm; HR-STEM resolution: 0.17 nm.
  • Maximum specimen tilt: 40°.
  • Drift rate: <1 nm / min.
  • Specimen holders: Double tilt and single tilt holders.
  • Energy Dispersive X-ray Spectrometer: EDAX rTEM with an ultrathin window allowing signal from boron to uranium.

Sample applications include:

  • Composition analysis structure of grain boundaries in ceramics
  • Lattice imaging of defects semi-conductor epitaxy, growth, and defects in analysis and metrology
  • Magnetic films on chromium
  • Identification of precipitates in materials

more info...