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Home > Instruments > Physical Electronics 545

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Surface and Thin-Film Analysis

Auger Electron Spectroscopy

Physical Electronics Model 545

Location: 22 Shepherd Labs

Contacts: John Thomas, Bing Luo

Specifications:

Sample Imaging with ~ 2 µm resolution
Auger elemental mapping
Multi-spot surface analysis
Thin Film Elemental Depth Profiling to ~ 1µm using ion beam sputtering
Auger Spatial Resolution to ~ 10 µm
Multi-sample handling

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