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Descriptions and Instructions
Proximal Nanoprobe (AFM & related)
Proximal Nanoprobes (AFM & related)
- Hysitron Triboindenter
- Micromechanical Tester
- MTS Nanoindenter XP
- Scanning Probe Microscopy (SPM)
- Tencor P‑10 Profilometer
Scanning and Transmission
Electron Microscopy
- Shepherd Labs Facility
- Environmental Scanning Electron Microscope (ESEM®) – Philips ElectroScan (DOWN)
- Field Emission Gun–Scanning Electron Microscope (FEG‑SEM) – JEOL 6500
- Field Emission Gun–Scanning Electron Microscope (FEG‑SEM) – JEOL 6700
- Field Emission Gun Transmission Electron Microscope (FEG‑TEM) – FEI Tecnai G2 30
- Transmission Electron Microscope (TEM) – FEI Tecnai T12
- Transmission Electron Microscope (TEM) – JEOL JEM‑1210
- Nils Hasselmo Hall Facility
- Cold Field Emission Gun Scanning Electron Microscope (FEG‑SEM) – Hitachi S‑4700
- Field Emission Gun Cryo Transmission Electron Microscope (Cryo FEG‑TEM) – FEI Tecnai G2 F30
- Field Emission Gun Scanning Electron Microscope (FEG‑SEM) – Hitachi S‑900
- Transmission Electron Microscope (TEM) – JEOL 1200 EXII
Specimen Preparation Equipment
Surface and Thin-Film
Analysis
- Ion Beam Analysis
- Auger Electron Spectroscopy – Physical Electronics Model 545
- Spectroscopic Ellipsometer – VASE
- X-ray Photoelectron Spectroscopy (ESCA) – Physical Electronics Model 555
- X-ray Photoelectron Spectroscopy (ESCA) – Surface Science SSX‑100
- Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) – Physical Electronics Instruments TRIFT
Vibrational
Spectroscopy
- Fourier Transform Infrared Spectrometer – Nicolet Magna‑IR 750
- Confocal Raman Microscope
Visible Light
Microscopy
- Phase-Measurement Interference Microscope – ZYGO Corp. Maxim 3D Model 5700
- Video and Computer-Enhanced Microscope – Nikon; Metamorph.
X-ray Diffraction &
Scattering
- Wide Angle
- Panalytical X'Pert Pro
- Theta-Theta Diffractometer – Scintag XDS 2000
- X-ray Diffractometer – Bruker‑AXS (Siemens) D5005
- X-Ray Diffractometer – Siemens D500
- Small Angle
- Microdiffraction
- Microdiffractometer – Bruker‑AXS
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