JEOL 6700 SEM

	Specialists: Dr. John Nelson Dr. Stuart McKernan
	Description
	Equipment
	Accessories
	Applications
	Specifications
	Sample Data
	Operating Instructions

A cold field-emission gun Scanning electron microscope (FEG-SEM). It operates at 0.5 to 30 kV with an ultimate resolution of 1.0 nm, and a magnification range of 10x to 700,000x. Available image modes include secondary and backscattered electron imaging.

• JEOL 6700 with a variety of sample holders.
• Backscattered imaging at TV rates and low voltage using the Centaurus detector.

• Back scatter detector
• Chamberscope for optical viewing specimen in the microscope.

• Examination of fracture surfaces
• Examination and quantification of nano-scratch tests
• Stereo-imaging of surfaces
• Microstructure of surfactant systems
• Measurement of the width of layers of magnetic read devices
• Characterization of grain boundaries of ceramics

• Sample size: 50 x 125 x 125 mm
• Lateral resolution: 1.0 nm
• Lateral range: 50 mm x 50 mm

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