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Photo of Ozan Ugurlu


Ozan Ugurlu

Electron Microscopy Specialist

(612) 626-3613


Education

Ph.D.   2006, Materials Science and Engineering, Iowa State University, Ames, IA
M.S.   2003, Ceramic Engineering, Alfred University, Alfred, NY
B.S.   2001, Materials Science and Engineering, METU, Ankara, Turkey


Professional Experience

2007 - present Research Associate and Electron Microscopy Specialist, Characterization Facility
2006 - 2007 Postdoctoral Fellow, Los Alamos National Laboratories, Los Alamos, NM (Terry G. Holesinger)
2006 - 2006 Postdoctoral Fellow, Ames Laboratory, Ames, IA (L. Scott Chumbley)
2003 - 2006 Research and Teaching Assistant, Materials Science and Engineering, Iowa State University, Ames, IA (L. Scott Chumbley)
2001 - 2003 Research and Teaching Assistant, Ceramic Engineering, Alfred University, Alfred, NY (Herbert Giesche)

Publications

  • O. Ugurlu, L.S. Chumbley, D.L. Schlagel and T.A. Lograsso "Characterization of an Atypical Widmanstätten Structure in Gd5Si2Ge2 Alloys" Acta Materialia v53 p 3525 – 3533, 2005.
  • O. Ugurlu, L.S. Chumbley, D.L. Schlagel and T.A. Lograsso "Orientation and formation of atypical widmanstätten plates in the Gd5(SixGe1-x)4 System" Acta Materialia, v54, n 5, p 1211-1219, 2006.
  • D. Wu, O. Ugurlu, L.S. Chumbley, M.J. Kramer and T.A. Lograsso "Synthesis and Characterization of Hexagonal Cd51Yb14 Single Crystals" Philosophical Magazine, v86, n 3-5, p 381-387, 2006.
  • I.J. Youngs, N. Bowler and O. Ugurlu "Dielectric relaxation in composites containing electrically isolated particles with thin semi-continuous metal coatings" Journal of Physics D: Applied Physics v39, p 1312-1325, 2006.
  • O. Ugurlu, L.S. Chumbley and C. Fischer "Persistence of 5:3 plates in RE5(Six, Ge1-x)4 alloys" Journal of Materials Research, v21, n 10, p 2669 - 2674, 2006.
  • O. Dolotko, H. Zhang, O. Ugurlu, J.W. Wiench, M. Pruski, L.S. Chumbley and V.K. Pecharsky "Mechanochemical transformations in Li(Na)AlH4 - Li(Na)NH2 systems" Acta Materialia, v55 p 3121-3130, 2007.
  • L.S. Chumbley, O. Ugurlu, R.W. McCallum, K. A. Gschneidner, V. K. Pecharsky and K.W. Dennis "Linear microstructural features in RE5(Six, Ge1-x)4-type alloys: Difficulties in identification" Acta Materialia, v 56, n 3, p 527 - 536, 2008.
  • A.T. Findiklioglu, O.Ugurlu and T.G. Holesinger "Aligned Crystalline Si Films on Glass Substrates" submitted to Advanced Materials, 2007.


Before joining the Characterization Facility, Dr. Ozan Ugurlu was a post-doc at the Los Alamos National Laboratory, working on microstructural characterization of superconductors.  He has been working with the electron microscopes since 2001.  At Iowa State University, he worked on TEM characterization of rare-earth alloys and alcanate hydrogen storage materials as a member of complex materials group.  In 2006, he received the Excellence in Research award from Iowa State University.  He managed the Materials Science and Engineering Department’s SEM laboratory for three years as a side project to his PhD research and received multiple TA awards for his efforts.

Dr. Ugurlu has close to 20 peer-reviewed journal articles and more than a dozen presentations at international microscopy and materials related conferences, such as MRS, MSA, TMS etc.  He is also an active reviewer for Journal of Materials Research and International Journal of Hydrogen Energy, where he reviewed numerous articles.

He earned his bachelor’s degree in Materials Science and Engineering from METU, Turkey in 2001.  He earned a master’s degree in Ceramic Engineering from Alfred University in 2003 and a doctorate in Materials Science and Engineering from Iowa State University in 2006.

Dr. Ugurlu is involved with the Transmission Electron Microscopy (TEM) and associated basic and advanced techniques such as Diffraction, High-Resolution TEM (HRTEM), Scanning TEM (STEM), Energy Dispersive Spectroscopy (EDS), Electron Energy Loss Spectroscopy (EELS), Energy Filtered TEM (EFTEM), etc.

He is also working on TEM and SEM related sample preparation techniques, including Focused Ion Beam (FIB).

His research interests include: TEM characterization of cross-sectional thin- and thick-films.  Hard materials, diffraction and crystallography studies, in-situ TEM experiments, high-resolution TEM (HRTEM) as well as Scanning TEM (STEM).