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John Kadlec

Assistant Scientist

(612) 624-4136


Education

University of St Thomas - Philosophy (pre-divinity)
US Army Signal Corps - Fixed Station Telecommunications
Control Data Institute - Main Frame Field Engineering


Professional Experience

  • Control Data Corporation - Thin Film Magnetic Memories
  • Physical Electronics - Field Service and Test, Field Service Manager (Europe), International Operations, Regional Sales - Surface Spectroscopy
  • VG Scientific - Regional Sales - Electron Spectroscopy, Microscopy and Molecular Beam Epitaxy
  • Applied Vision - Vice President for North American Operations - Sputtered Ophthalmic Anti-Reflective Coating
  • Ulvac Technologies - Senior Field Service- Sputtering Systems


At UMNTC since January 2002 John has 32+ years experience in Vacuum Technology, Thin Films and Electron Spectroscopy, from both technical and business sides.  At CharFac he maintains instruments and helps researchers with specimen preparation.  At present he is involved in restoring Scanning Auger Electron (AES) and Xray Photoelectron (XPS) Spectrometers.

"CharFac has substantial expertise and instrumentation for 2D and bulk characterization of nano scale materials.  In the real world, surface and interface properties are considerably different than bulk.  Because of the relatively short atomic distances electrons travel in solid materials (before undergoing scattering and losing characteristic energy), the strength of electron spectroscopy clearly lies in its surface sensitivity.  These techniques not only can identify all elements above He, they can give both quantitative and chemical state information.  We hope to demonstrate just how important access to the "Z" direction is and how these techniques bring another dimension to the existing analytical methods that CharFac is well recognized for."