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Nanotechnology News from the Characterization Facilty and the Nanofabrication Center.

Location:  69 Shepherd Labs

Contacts:  TBD

Instruction manual

Description:

The Zygo Phase-Measurement Interference Microscope is used to measure the surface topography and micro geometry of surfaces using interference of a laser illumination to determine the height of each point in an image.  The tallest feature that can be measured is 1.2 µm.  Intensity and topography data can be imported into image processing and analysis software.

Specifications:

• Vertical resolution: 0.5 nm
• Lateral resolution: 0.3µm
• Vertical range: 1.2 µm
• Lateral range: 1 mm

more info...