What's Inside

• About Us
• Education
• Image Gallery
• Instruments
• Instrument Status
• News
• Sign In/Out & Reservations
• Staff
• User Info & Policies

Nanotechnology News from the Characterization Facilty and the Nanofabrication Center.

 
4 of 6

Home > Instruments > PHI-555

Surface and Thin-Film Analysis X-ray Photoelectron Spectroscopy (ESCA) Physical Electronics Model 555

Specifications:

• Non-monochromatic Mg/Al K-α X-ray source
• Surface Analysis and Chemical Depth Profiling using ion beam sputtering
• Spatial Resolution ~2 mm
• Energy Resolution to ~1.3 eV
• Sample Handling single sample with either room temperature or Hot (~350°C) and Cold (~ -50°C) stages