Location: 87 Shepherd Labs
Contacts: Greg Haugstad, Jinping Dong
SPM Overview and common instrument characteristics
Specifications:
- Nikon optical microscope with CCD and image capture for tip positioning.
- Nano-K Biscuit vibration isolation platform.
- Hysitron-SPM combination enables nanoindentation, microscratch, and other mechanical tests along with in situ high-resolution imaging.
- Maximum load is approximately 2 mN and force resolution is 100 nN with Hysitron tester.
- Maximum scan size 150 x 150 µm laterally and 5.6 µm vertically.


