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CharFac is one of three U of M participants in the National Nanotechnology Infrastructure Network (NNIN).  Read about our activities in Nanotechnology News.

 
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Home > Instruments > Nanoindenter

Proximal Nanoprobe MTS Nanoindenter XP

Specifications with Continuous Stiffness Measurement:

• Maximum Depth - 500 µm
• Depth Resolution - <0.01 nm
• Maximum Load - 500 mN (10N high load)
• Load Resolution - 50 nN

Specifications with Dynamic Control Module:

• Maximum Depth - 15 µm
• Depth Resolution - 0.0002 nm
• Maximum Load - 10 mN
• Load Resolution - 1 nN

more info...