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Field Emission Gun
Scanning Electron Microscope

JEOL 6700

Description:

A cold field-emission gun Scanning electron microscope (FEG-SEM).  It operates at 0.5 to 30 kV with an ultimate resolution of 1.0 nm, and a magnification range of 10x to 700,000x.  Available image modes include secondary and backscattered electron imaging.

Equipment:

  • JEOL 6700 with a variety of sample holders.
  • Backscattered imaging at TV rates and low voltage using the Centaurus detector.

Accessories:

  • Back scatter detector
  • Chamberscope for optical viewing specimen in the microscope.

Applications:

  • Examination of fracture surfaces
  • Examination and quantification of nano-scratch tests
  • Stereo-imaging of surfaces
  • Microstructure of surfactant systems
  • Measurement of the width of layers of magnetic read devices
  • Characterization of grain boundaries of ceramics

Capabilities:

  • Sample size: 50 x 125 x 125 mm
  • Lateral resolution: 1.0 nm
  • Lateral range: 50 mm x 50 mm