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X-ray Diffraction & Scattering
Wide Angle

Siemens D-500

Description:

Wide-angle x-ray scattering is used to study structural characteristics and to identify powders, thin films, crystals, and solutions.  Data analysis is performed using Materials Data Incorporated's JADE 7.0 software package with whole pattern fitting.  Phase identification is possible using ICDD's PDF-4 database.  The 40 position sample changer can be used to analyze a large number of samples automatically.

Equipment:

  • Siemens D-500 Diffractometer with 2.2 kW sealed cobalt source
  • Single Crystal Graphite Monochromater
  • Scintillation Counter Detector

Accessories:

Applications:

  • Phase identification
  • Thin-film analysis
  • Lattice parameter determination
  • Purity/quality control of materials
  • Determination of crystallinity of polycrystalline materials
  • Stress analysis
  • Orientation of single crystals
  • Analysis of superlattice structures
  • Particle size determination
  • Quantitative analysis

Sample Data:


Crystallite Size Determination




Magnification of Smaller Peaks




Peak Fitting and Percent Crystallinity




Phase Identification