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X-ray Diffraction & Scattering

Small-Angle X-ray Scattering
2 meter 2D Area Detector

Description:

This small-angle scattering beamline incorporates high-flux optics, in situ control of sample temperature, and an area detector.  The intense beam generated by this instrument makes it ideal for obtaining time-resolved measurements, such as crystallization behavior, phase transformation kinetics, and response to mechanical deformation.  Samples can be analyzed in many forms, including solutions, fibers, films, and powders.

Equipment:

  • Rigaku 12kW rotating anode with Cu source and point focus.
  • Frank Mirrors.
  • Siemens Hi-Star multi-wire area detector.

Accessories:

Completely automated in situ control of sample temperature (-40° C to 200° C) with rapid (1° C/second) heating and cooling.

Applications:

  • Structural analysis of microstructures including time-resolved measurements, such as crystallization behavior, phase transformation kinetics, and response to mechanical deformation.
  • Study of oriented structures.
  • Pore size distribution measurements.
  • Measurement of dimensions and symmetries of microstructured materials (block copolymers, surfactant suspensions, zeolites, liquid crystals).
  • Determination of radius of gyration of microspheres.
  • Analysis of lamellar systems.
  • Thin-film characterization.
  • Study of microstructural aspects of mechanical deformation.

Capabilities:

Data can be taken over angles from 0.18 to 38 degrees (depending on detector setting) which corresponds to structural features from 0.25 to 50 nm.  Samples in many forms, including solutions, fibers, films, and powders, can be analyzed.

Sample Images:


Styrene-isoprene-styrene triblock copolymer oriented through large-strain oscillatory shear.  The sample forms an array of hexagonally-packed cylinders.  The beam is parallel to the cylinders.  Exposure time: 2 minutes at 170° C. Sample courtesy of C. J. Ryu and T. P. Lodge, Dept. of Chemistry--U of MN.