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Nanotechnology News from the Characterization Facilty and the Nanofabrication Center.

Home > Instruments

Facility Instruments

Instrument Sign In/Out and Reservations
   Instructions for the scheduling system.  [  PDF 538kB]

Check the current availability of facility instruments

Academic Rates (all U.S. higher education institutions)  [  PDF 37kB]

Remote Access

File Storage and Access

Descriptions and Instructions

Proximal Nanoprobe (AFM & related)

Proximal Nanoprobes (AFM & related)

• Hysitron Triboindenter
• Micromechanical Tester
• MTS Nanoindenter XP
• Scanning Probe Microscopy (SPM)
  • SPM Overview
  • SPM1: Bruker Nanoscope III Multimode
  • SPM2: Bruker Nanoscope III Multimode
  • SPM3: Agilent 5500 environmental SPM plus inverted light microscope
  • SPM4: Agilent 5500 environmental SPM plus high-speed force-curve mapping and multifrequency methods
• Tencor P‑10 Profilometer

Scanning and Transmission Electron Microscopy

Scanning and Transmission Electron Microscopy

• Shepherd Labs Facility
  • Field Emission Gun–Scanning Electron Microscope (FEG‑SEM) – JEOL 6500
  • Field Emission Gun–Scanning Electron Microscope (FEG‑SEM) – JEOL 6700
  • Field Emission Gun Transmission Electron Microscope (FEG‑TEM) – FEI Tecnai G2 30
  • Transmission Electron Microscope (TEM) – FEI Tecnai T12
• Nils Hasselmo Hall Facility
  • Cold Field Emission Gun Scanning Electron Microscope (FEG‑SEM) – Hitachi S‑4700
  • Field Emission Gun Cryo Transmission Electron Microscope (Cryo FEG‑TEM) – FEI Tecnai G2 F30
  • Field Emission Gun Scanning Electron Microscope (FEG‑SEM) – Hitachi S‑900
  • Transmission Electron Microscope (TEM) – JEOL 1200 EXII
• Moos Tower Facility
  • Transmission Electron Microscope (TEM) – FEI Tecnai G2 Spirit BioTWIN

Specimen Preparation Equipment

Surface and Thin-Film Analysis

Surface and Thin-Film Analysis

• Auger Electron Spectroscopy – Physical Electronics Model 545
• Ion Beam Analysis: Rutherford backscattering and related (PIXE, NRA/PIGE, FReS, channeling)
• Microscopic Contact Angle Meter
• Spectroscopic Ellipsometer – VASE
• X-ray Photoelectron Spectroscopy (ESCA) – Physical Electronics Model 555
• X-ray Photoelectron Spectroscopy (ESCA) – Surface Science SSX‑100

Vibrational Spectroscopy

Vibrational Spectroscopy

• Fourier Transform Infrared Spectrometer – Nicolet Magna‑IR 750
• Confocal Raman Microscope

Visible Light Microscopy

Visible Light Microscopy

• Video and Computer-Enhanced Microscope – Nikon; Metamorph.

X-ray Diffraction & Scattering

X-ray Diffraction & Scattering

• Wide Angle
  • Panalytical X'Pert Pro
  • Theta-Theta Diffractometer – Scintag XDS 2000
  • X-ray Diffractometer – Bruker‑AXS (Siemens) D5005
  • X-Ray Diffractometer – Siemens D500
• Small Angle
  • 2 meter – 2D Area Detector
  • 6 meter – High Resolution – 2D Area Detector
  • SAXSess
• Microdiffraction
  • Microdiffractometer – Bruker‑AXS
  • Diffractometer – Bruker D8 Discover 2D
  • Diffractometer – D8 Advance