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Nanotechnology News from the Characterization Facilty and the Nanofabrication Center.

This image is an Environmental Scanning Electron Microscope (ESEM) image of some air-dried Jack Pine pollen grains collected from near Mio in Michigan.  The 30 kV electrons penetrate right through the pollen grains, giving the image an "X-ray" appearance where grains can be seen through each other.

Other images in this series:
   10 kV image | 5 kV image | 3 kV image