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The Bruker-AXS Microdiffractometer

	Specialists: Linda Sauer Ryan Wold
	Description
	Equipment
	Applications
	Specifications
	Sample Data
	Operating Instructions

User Guideline Agreement

Radiation and Lab Safety

Wide-angle X-ray scattering is used to study structural characteristics and to identify powders, thin films, and crystals.

Microdiffraction can be used for x-ray analysis of very small samples or small areas of larger samples. The x-ray beam can be collimated down to a 50 micron spot size. A video-microscope and laser pointer allows for the beam's precise positioning. The multi-wire two-dimensional area detector allows for quick data acquisition and orientation information. This detector, combined with the 1/4 circle Eulerian cradle sample holder is perfect for pole figure (texture) analysis.

• Bruker-AXS Microdiffractometer with 2.2 kW Sealed Cu X-ray Source
• Incident Beam Monochromater
• 1/4 circle Eulerian Cradle Sample Holder
• Hi-Star 2-D Area Detector
• Temperature Control (-20° to 200° C)
• Optional Chromium X-Ray Source

• Phase identification
• Thin-film analysis
• Lattice parameter determination
• Purity/quality control of materials
• Determination of crystallinity of polycrystalline materials
• Stress analysis
• Orientation of single crystals
• Particle size determination
• Pole figure (texture) analysis

Samples can be analyzed in bulk, powder, thin film and solution form.

• Corundum in a Capillary
• Two-Dimensional X-ray Detector Image of Corundum
• Integrated Images of Corundum
• Microdiffractometer Analysis of Fiber Bundle
• Close-up of Fiber Bundle
• Two-Dimensional Detector Image of Fiber Analysis
• Two-theta vs. Intensity Scan of Fiber
• Copper Computer Part for Microdiffractometer Analysis
• Close-up of Copper Part -- Stress Analysis may be done
• Microdiffraction of a Silicon Wafer (Single Crystal)

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